Test Parameters

 Value is  the input parameters fed to the PerformTest function
 0) ADC Saturation                               ,                Error, if value = TRUE
        Value is if INST_raw_data_header.ADC_saturation_bitfields[card] == 1 for any point in collect_raw

 1) ADC Signal too large                         ,        value =(E:    1.000)   W:    1.000
        Value is if INST_raw_data_header.ADC_high_threshold_bitfields[card] == 1 for any point during scan

 2) Sigma is Zero                                ,        value =(E:    0.000)   W:    0.000
        Sometimes all 16 turns come back with the same value, so this is to monitor if that happens again in the future.

 3) ADC Signal too small                         ,                Error, if value = TRUE
        Value is if INST_raw_data_header.ADC_low_threshold_bitfields[card] == 1 for all points during scan

 4) Block Delay value too near high edge         ,                W:  200.000    E:  100.000 <= value   (Block Delay - maxspan) - 100,
        value computed before time scan run
 5) Block Delay value too near low edge          ,       value <= E:  100.000    W:  200.000            Value is Block Delay

 6) Offset too near high edge                    ,                W:  923.000    E:  973.000 <= value   Max chip value (1023) - 50, 100
 7) Offset too near low edge                     ,       value <= E:   50.000    W:  100.000            Min chip value (0) + 50, 100
 8) Chip offsets too far apart                   ,                W:   70.000    E:  200.000 <= value
 9) Min too far from Peak                        ,             v2*W: 1100.000 v2*E: 1200.000 < 10000*v1  fraction: v1/v2, v1 = maxAmp-minAmp, v2 = maxAmp

10) (Difference of cross sums/Max Amp) too high  ,             v2*W: 4200.000 v2*E: 6000.000 < 10000*v1  v1 = Difference of cross sums, v2 = Max Amp
11) 2nd order term in fit too high               ,             v2*W:    7.556 v2*E:    8.756 < 10000*v1
12) 2nd order term in fit too low                , 10000*v1 <= v2*E:    2.556 v2*W:    4.356
        ratio of -1.0 * term to max amplitude should be roughly 1/1800 = 0.000556, so 10000 * val ~= 5.56

13) Linear term in fit too high                  ,             v2*W:  175.000 v2*E:  225.000 < 10000*v1
14) Linear term in fit too low                   , 10000*v1 <= v2*E:   25.000 v2*W:   75.000
        ratio of term to max amplitude should be roughly 1/80 = 0.0125, so 10000/80 ~= 125

15) Constant term in fit too low                 , 10000*v1 <= v2*E: 7200.000 v2*W: 8600.000
        ratio of term to max amplitude should be roughly 1 so 10000*1 = 10000

16) Fit value too near high edge                 ,                W:   14.000    E:   16.000 <= value   Max fit value (2*CBPM_CAL_RADIUS) - 4
17) Fit value too near low edge                  ,       value <= E:    4.000    W:    6.000            Min fit value (0) + 4

18) RMS too big before timing adjust             ,                W:  700.000    E: 1400.000 <= value
        Before adjusting the timing the RMS from 1024 turns is too big

19) RMS too big after timing adjust              ,                W:  120.000    E:  400.000 <= value
        After adjusting the timing the RMS from 1024 turns is too big

20) Chipvalue changed too much                   ,                W:   40.000    E:  200.000 <= value
21) Chip to chip value changed too much          ,                W:    4.000    E:   20.000 <= value
22) Peak scan took too long                      ,                W:  620.000    E:  630.000 <= value
23) Too many time scan tries                     ,                W:    3.000    E:    4.000 <= value
24) Absolute Value of Block Delay slosh too big  ,                W:   50.000    E:  500.000 <= value
25) ALU Error                                    ,                Warning, if value = TRUE